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United States Department of Agriculture

Agricultural Research Service

Related Topics

Scott Beil
Corn, Soybean and Wheat Quality Research Unit
Physical Science Technician

Phone: (330) 263-3892
WILLIAMS HALL
1680 MADISON AVE
WOOSTER, OH, 44691


Publications (Clicking on the reprint icon Reprint Icon will take you to the publication reprint.)
Overseas Varietal Analysis 2011 Crop Soft Red Winter Wheat - (Government Publication)
Beil, S.E., Redinbaugh, M.G. 2013. Overseas Varietal Analysis 2011 Crop Soft Red Winter Wheat. Government Publication/Report. 2010 U.S. Wheat Associates Overseas Varietal Analysis Project. U.S. Wheat Associates, Washingon DC.
Overseas Varietal Analysis 2010 Crop Soft Red Winter Wheat - (Government Publication)
Beil, S.E., Sturbaum, A.K., Wade, W.D., Redinbaugh, M.G. 2012. Overseas Varietal Analysis 2010 Crop Soft Red Winter Wheat. 2010 U.S. Wheat Associates Overseas Varietal Analysis Project. U.S. Wheat Associates, Washington DC.
Milling and Baking Test Results for Eastern Soft Wheats - (Government Publication)
Hancock, B., Beil, S.E., Redinbaugh, M.G. 2012. Milling and Baking Test Results for Eastern Soft Wheats. Wheat Quality Council 2011 Harvest, February 14, 2012, Kansas City Missouri.
Genetic Linkage Mapping of the Soybean Aphid Resistance Gene in PI 243540 Reprint Icon - (Peer Reviewed Journal)
Mian, R.M., Kang, S., Beil, S.E. 2008. Genetic Linkage Mapping of the Soybean Aphid Resistance Gene in PI 243540. Journal of Theoretical and Applied Genetics. 117:955-962.
Last Modified: 9/2/2014
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