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United States Department of Agriculture

Agricultural Research Service

Research Project: Develop High-Throughput Markers for Genetic Improvement of Wheat for Multiple Traits

Location: Hard Winter Wheat Genetics Research Unit

Project Number: 5430-21000-010-16
Project Type: Specific Cooperative Agreement

Start Date: Sep 01, 2012
End Date: Aug 30, 2017

Objective:
Develop and implement next generation molecular marker technology in wheat breeding.

Approach:
Mapping populations will be analyzed using the 90K wheat SNP chip and SSR markers and detailed SNP/SSR maps will be constructed and used for mapping of important loci controlling disease resistance, abiotic stress tolerance, grain quality, etc. Low-throughput markers reported for different genes will be converted into a set of high throughput SNP markers by LD analysis of 90K SNP chip. Developed SNPs will be assembled into sets of 30-35 SNP markers to be analyzed in Sequenom MassArray and validated using different mapping populations. Those marker sets will be used for selection of multiple traits in breeding programs.

Last Modified: 9/21/2014
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