Author
GELIN, JEAN - NORTH DAKOTA STATE UNIV | |
Arelli, Prakash | |
ROJAS-CIFUENTES, GONZALO - NORTH DAKOTA STATE UNIV |
Submitted to: Crop Science
Publication Type: Peer Reviewed Journal Publication Acceptance Date: 8/4/2006 Publication Date: 10/10/2006 Citation: Gelin, J.R., Arelli, P.R., Rojas-Cifuentes, G.A. 2006. Using independent culling to identify sources of dual resistance to cyst nematode and sudden death syndrome among soybean plant introductions. Crop Science. 46:2081-2083. Interpretive Summary: Soybean yields in USA are limited by two major pathogens, soybean cyst nematode (SCN) and sudden death syndrome (SDS). SCN is a microscopic-size worm attacking roots of the soybean plant and sudden death syndrome is a fungal disease attacking leaves of the plant. Resistant cultivars have been the most effective means of controlling these pathogens. When these pathogens occur together in the fields, the yield losses will be disproportionately much higher than either one alone. Breeders are developing varieties with dual resistance but proper methods are not available for selection. We have evaluated 31 new soybean plant introductions in the field and selected elite soybean line using independent culling as a strategy. These lines were dual resistant to SCN and SDS. These superior genotypes can be used as potential parents in soybean breeding programs for developing resistant cultivars. The growers will have reduced burden from these pathogens. Technical Abstract: Two infectious diseases that cause most yield losses in soybean [Glycine max (L.) Merr.] are soybean cyst nematode (SCN), caused by Heterodera glycines Ichinohe, and sudden death syndrome (SDS), caused by Fusarium solani (MART.) Sacc. f. sp. glycines (Fsg). Because SCN and SDS have a synergistic effect on yield when they occur jointly in the field, breeders are attempting to develop varieties with dual resistance to these two diseases. Using independent culling as a selection strategy, we screened a set of 31 new soybean plant introductions (PI) that were field evaluated in 1995 at two locations in Southern Illinois. We identified 11 elite PIs that were resistant to SCN race 3, had yellow seed coat, a relatively good field response to SDS, and a moderate seed yield. These superior genotypes can be used as potential parents in soybean breeding program for developing cultivars resistant to dual pathogens. |