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United States Department of Agriculture

Agricultural Research Service

Title: Corn Yield Response to Fertilizer from An Applicator Designed to Reduce Nitrate Leaching

Authors
item Ressler, D - IOWA STATE UNIVERSITY
item Horton, R - IOWA STATE UNIVERSITY
item Kaspar, Thomas
item Baker, J - IOWA STATE UNIVERSITY

Submitted to: American Society of Agronomy Meetings
Publication Type: Abstract Only
Publication Acceptance Date: October 26, 1997
Publication Date: N/A

Technical Abstract: Localized Compaction and Doming (LCD) is proposed as a way to alter water flow paths around a knife injected nitrogen (N) fertilizer band and reduce N leaching. On croplands where N is limiting, N preserved in the root zone is available for crop uptake and can lead to increased yield. Corn (Zea mays) plots were fertilized using conventional knife and LCD applicators at four rates (67, 112, 157, and 202 kg ha**-1). Grain yield was measured at the end of the growing season. In a drier than average growing season, there were no differences in yield. In a wetter than average growing season, grain yield was greater for each fertilization rate from plots receiving LCD injected N. These data suggest that the LCD applicator reduced leaching, which preserved N in the root zone and allowed greater N uptake for grain production.

Last Modified: 10/20/2014
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