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United States Department of Agriculture

Agricultural Research Service

Title: Evaluation of Wheat for Resistance to Glume Blotch Using Detached Leaves and Spikelets

item Kisha, Theodore - PURDUE UNIVERSITY
item Goodwin, Stephen
item Ohm, Herbert - PURDUE UNIVERSITY

Submitted to: Agronomy Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: November 8, 2000
Publication Date: N/A

Technical Abstract: Detached leaves and spikelets from wheat lines both susceptible and resistant to Stagonospora nodorum blotch were evaluated in Benzimidazol agar. The detached-leaf assay consistently separated resistant and susceptible lines. Lesion size measured ten days after inoculation gave the greatest separation among lines. Latent period, the time from inoculation to the appearance of pycnidia, was significantly longer in the more resistant wheats than in the susceptible ones. Cultivars and lines observed as resistant in the field were consistently identified as resistant, while those known to be susceptible in the field also stood out as susceptible by the detached-leaf assay. Quantitative evaluation using detached glumes was difficult, because infection appeared to affect the entire spikelet. However, a subjective evaluation separated resistant lines from susceptible. The resistance in glumes has been reported as genetically distinct from that in leaves. Our results confirmed that resistance in leaves does not correlate with that in glumes.

Last Modified: 4/22/2015
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