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Title: REGISTRATION OF 'PATTERSON' WHEAT

Authors
item Ohm, Herbert - PURDUE UNIVERSITY
item Shaner, Greg - PURDUE UNIVERSITY
item Ratcliffe, Roger
item Huber, Donald - PURDUE UNIVERSITY
item Buechley, George - PURDUE UNIVERSITY
item Cambron, Sue - PURDUE UNIVERSITY

Submitted to: Crop Science
Publication Type: Germplasm Release
Publication Acceptance Date: September 30, 1997
Publication Date: N/A

Interpretive Summary: This is a Germplasm Release; no Interpretive Summary Required.

Technical Abstract: 'Patterson' soft red winter wheat (Triticum aestivum L.) was developed by the Purdue University Agricultural Research Programs in cooperation with the USDA-ARS. It was released in 1995 because of its unique combination of high productivity, cold tolerance, early maturity, excellent milling and baking qualities, and resistance to several important fungal and virus pathogens in Indiana and the eastern USA. Patterson has high yield potential, producing 5306 kg ha-1 (compared with 4465 kg ha-1 for Caldwell) averaged over 5 yr at W. Lafayette, IN. Patterson heads 2 d earlier than Caldwell, but is very winterhardy (like Auburn). It has good test weight and excellent soft wheat milling and baking qualities. Patterson has resistance to leaf rust (caused by Puccinia recondita Roberge ex Desmaz.), septoria blotch (caused by Septoria tritici Roberge in Desmaz.), wheat soilborne mosaic virus (SBWMV), wheat spindle streak mosaic virus (WSSMV), and Hessian fly [Mayetiola destructor (Say)] biotypes B and D (genes H5 an H6). It has tolerance to take-all [caused by Gaeumannomyces graminis (Sacc.) Arx & D. Olivier var. tritici J. C. Walker] and is susceptible to powdery mildew (caused by Erysiphe graminis DC. f. sp. tritici Em. Marchal; syn. Blumeria graminis) in Indiana. The generation sequence of seed production is foundation and certified. Patterson is protected under the U. S. Plant Variety Protection Act. Breeder seed is maintained by the Purdue University Agricultural Research Programs, West Lafayette, IN.

   
 
 
Last Modified: 05/25/2013
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