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ARS Home » Midwest Area » Ames, Iowa » Corn Insects and Crop Genetics Research » Research » Publications at this Location » Publication #112777

Title: GENETIC AND PHYSICAL MAP CORRELATION

Author
item PAZ, MARGIE - IOWA STATE UNIVERSITY
item SHOEMAKER, RANDY

Submitted to: Encyclopedia of Life Sciences
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 6/30/2000
Publication Date: N/A
Citation: N/A

Interpretive Summary: The soybean disease, Brown stem Rot, results in a loss of production of over 20 million bushels each year in the North Central States alone. Genes for resistance to this disease are present in some soybean lines. However, selecting for resistance is expensive and time consuming. Molecular markers tightly linked to the resistance genes would make selection faster, cheaper rand more efficient. The authors developed nine markers which can predict resistance among progeny of a segregating population with an accuracy of 91-98%. These markers will allow breeders to incorporate Brown Stem Rot resistance into high yielding cultivars faster and cheaper than before. This will result in higher soybean yields and more stable production.

Technical Abstract: The era of genomics has allowed scientists new glimpses of the organization and structure of genomes of many genera. Mapping of genomes has included genetic and physical components. This article reviews the techniques used in these genomic studies such as gene mapping, in situ hybridization, contig construction, and molecular marker development. Comparisons of genetic maps of various genera has uncovered a great degree of syntery. Alignment of maps to show co-linearity also resolves deviations or differences between genetic map distance and physical map distances. This paper reviews examples of these differences and discusses various reasons for the differences.