Author
BARTLEY JR, PHILIP - OLD DOMINION UNIVERSITY | |
MCCLENDON, RONALD - UNIVERSITY OF GEORGIA | |
Nelson, Stuart |
Submitted to: International Workshop on Virtual and Intelligent Measurement Systems
Publication Type: Proceedings Publication Acceptance Date: 9/12/2000 Publication Date: N/A Citation: N/A Interpretive Summary: Technical Abstract: A fuzzy logic inference system (FLIS) was designed to determine the dielectric properties of material. The inputs to the FLIS are the admittance measurement made on an open-ended coaxial line immersed in the material of interest and the measurement frequency. The measurement frequency ranged from 200 MHz to 6 GHz. A network analyzer was used to make the measurements. R-squared values in excess of 0.99 were obtained when the output of the FLIS was compared to known values. This approach greatly simplifies the characterization of dielectric measurement probes. |