Author
Dowell, Floyd | |
BORATYNSKI, THEODORE - USDA, APHIS BRAWLEY, CA | |
YKEMA, RONALD - STATE AG. LABORAATORY, AZ | |
DOWDY, ALAN - USDA, APHIS RALEIGH, NC | |
STATEN, ROBERT - USDA, APHIS, PHOENIX, AZ |
Submitted to: Plant Disease
Publication Type: Peer Reviewed Journal Publication Acceptance Date: 5/10/2002 Publication Date: 10/1/2002 Citation: DOWELL, F.E., BORATYNSKI, T.N., YKEMA, R., DOWDY, A.K., STATEN, R.T. USE OF OPTICAL SORTING TO DETECT WHEAT KERNELS INFECTED WITH TILLETIA INDICA. PLANT DISEASE. 2002. v. 86(9). p. 1011-1013. Interpretive Summary: Karnal bunt is a fungus that affects wheat seeds, and is subject to international regulation by 78 countries. Karnal bunt was found in the US in 1996, and has spread to several states since then. This has resulted in the quarantine of wheat from several counties, and significant financial losses to local communities. The current sampling scheme is subjective and dlabor intensive. We investigate the use of a high-speed sorter to remove bunted kernels from samples to speed the inspection process and reduce detection errors. When the sorter removed 8% or more of the sample, the reject portion contained 100% of the bunted kernels. One high-speed sorter can process up to 8800 kg/hr, thus bunted kernels can be rapidly removed from samples or large lots. This technology provides the wheat industry with a tool to rapidly inspect samples to aid in regulating Karnal bunt, and to remove bunted grains from seed wheat and wheat destined for food or feed use. Technical Abstract: A high-speed sorter was used to remove kernels infected with Karnal bunt from 1800g wheat samples. When the sorter removed about 8% or more of the sample, the reject portion contained 100% of the bunted kernels. Concentrating the bunted kernels in a smaller sample size will reduce sample inspection time and should reduce inspection errors. One high-speed dsorter can process up to 8800 kg/hr, thus bunted kernels can be rapidly removed from samples or large lots. The instrument sorted each sample in less than 1 minute. This technology provides the wheat industry with a tool to rapidly inspect samples to aid in regulating Karnal bunt, and to remove bunted grains from seed wheat and wheat destined for food or feed use. |