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ARS Home » Research » Publications at this Location » Publication #131168
Title: QTL MAPPING OF PARTIAL RESISTANCE IN WHEAT TO STAGONOSPORA NODORUM BLOTCH

Author
item CZEMBOR, P - DEPT OF PLANT PATH POLAND
item ARSENIUK, E - DEPT OF PLANT PATH POLAND
item Ueng, Peter

Submitted to: Phytopathology
Publication Type: Abstract Only
Publication Acceptance Date: 3/20/2002
Publication Date: N/A
Citation: N/A

Interpretive Summary:

Technical Abstract: A population of 111 doubled-haploid lines derived from a cross between a resistant wheat cultivar "Liwilla" and a susceptible cultivar "Begra" was screened for partial resistance toward Stagonospora nodorum under controlled conditions. Three resistance components, such as length of incubation period (INC), length of latent period (LAT) and disease severity (DIS), were evaluated. Bulk segregant analysis was used to detect the microsatellites and putative resistance gene analogs related to QTL resistance loci. Using the interval mapping method, four markers with LOD values higher than 3.0 on different chromosomes were detected: PtoKin(185,-) (2B), gwm499 (5B), gwm389 (3B) and gwm205 (5D). Of these molecular markers, gwm499 (5B) accounted for 19.3% of the variation in INC, 22.3% in DIS and 20.8% in LAT. There was another uncharacterized locus between Xgwm205 and Xgwm212 loci on chromosome 5D, which had a LOD value higher than 3.0 and accounted for 19-37% of the variation in three resistance components.