Author
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JUNG, WON-KYO - UNIV OF MO |
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Kitchen, Newell |
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Sudduth, Kenneth - Ken |
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Kremer, Robert |
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MOTAVALLI, PETER - UNIV OF MO |
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ANDERSON, STEPHEN - UNIV OF MO |
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Alberts, Edward |
Submitted to: ASA-CSSA-SSSA Annual Meeting Abstracts
Publication Type: Abstract Only Publication Acceptance Date: 7/23/2003 Publication Date: 11/3/2003 Citation: Jung, W., Kitchen, N.R., Sudduth, K.A., Kremer, R.J., Motavalli, P., Anderson, S.H., Alberts, E.E. 2003. Sensor-based soil electrical conductivity as a measure of soil quality on claypan soils [abstract] [CD-ROM]. ASA-CSSA-SSSA Annual Meeting Abstracts. Interpretive Summary: Technical Abstract: Understanding the relationship between sensor measurements and soil properties is essential for developing site-specific field management practices. The objective of this research was to understand the relationship between sensor-based apparent profile soil electrical conductivity (ECa) and soil quality properties. Soil samples at three depths (0 to 7.5 cm, 7.5 to 15 cm and 15 to 30 cm depth) were taken within a 4-ha claypan soil field located in mid-Missouri and were analyzed for physical, chemical, and microbial properties that serve as soil quality indicators. Data was collected with an electromagnetic induction-based ECa sensor (Geonics EM38) three times during the growing season and once immediately after harvest at each of the soil sampling locations. Correlation and regression analyses were used to develop relationships between soil quality indicators and sensed ECa. Clay content and CEC were positively correlated with ECa and showed the greatest correlation coefficient at the 15 to 30 cm sampling depth. Silt content and soybean yield were generally negatively correlated with ECa. A quadratic regression model using ECa gave the best prediction of soil quality indicators for all three sampling depths. Our results suggest that sensor-based ECa can be a quick and economic way of evaluating claypan soil quality, especially for soil physical properties. |