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ARS Home » Plains Area » Fargo, North Dakota » Edward T. Schafer Agricultural Research Center » Cereal Crops Research » Research » Publications at this Location » Publication #237766
Title: Identification of Novel QTL for Seeding and Adult Plant Leaf Rust Resistance in a Wheat Doubled Haploid Population

Author
item CHU, C - North Dakota State University
item Friesen, Timothy
item Xu, Steven
item Faris, Justin
item Kolmer, James

Submitted to: Theoretical and Applied Genetics
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 4/6/2009
Publication Date: 7/1/2009
Citation: Chu, C.G., Friesen, T.L., Xu, S.S., Faris, J.D., Kolmer, J.A. 2009. Identification of Novel QTL for Seeding and Adult Plant Leaf Rust Resistance in a Wheat Doubled Haploid Population. Theoretical and Applied Genetics. 119:263-269

Interpretive Summary: Combining multiple wheat genes that confer partial resistance is a method for developing wheat cultivars with durable resistance to leaf rust. In this research, we identified genes conferring partial resistance to leaf rust in both the adult plant and seedling stages. The majority of the resistance quantitative trait loci (QTL) identified is novel and came from the synthetic hexaploid wheat line TA4152-60. The QTL and the associated molecular markers identified in this research can be used to develop wheat cultivars with potentially durable leaf rust resistance.

Technical Abstract: Pyramiding of genes that confer partial resistance is a method for developing wheat (Triticum aestivum L.) cultivars with durable resistance to leaf rust caused by Puccinia triticina. In this research, a doubled haploid (DH) population derived from the cross between the synthetic hexaploid wheat (SHW) (×Aegilotriticum spp. ) line TA4152-60 and the North Dakota breeding line ND495 was used for identifying genes conferring partial resistance to leaf rust in both the adult plant and seedling stages. Five QTLs located on chromosome arms 3AL, 3BL, 4DL, 5BL and 6BL were associated with adult plant resistance with the latter four representing novel leaf rust resistance QTL. Resistance effects of the 4DL QTL were contributed by ND495 and the effects of the other QTLs were contributed by the SHW line. The QTL on chromosome arm 3AL had large effects and also conferred seedling resistance to leaf rust races MJBJ, TDBG and MFPS. The other major QTL, which was on chromosome arm 3BL, conferred seedling resistance to race MFPS and was involved in a significant interaction with a locus on chromosome arm 5DS. The QTLs and the associated molecular markers identified in this research can be used to develop wheat cultivars with potentially durable leaf rust resistance.