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Title: Differentiating stress induced by greenbugs and Russian wheat aphids in wheat using remote sensing

Author
item YANG, ZHIMING - Delaware State University
item RAO, MAHESH - Oklahoma State University
item Elliott, Norman - Norm
item KINDLER, S - Retired ARS Employee
item POPHAM, THOMAS - Retired ARS Employee

Submitted to: Computers and Electronics in Agriculture
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 3/16/2009
Publication Date: 6/1/2009
Citation: Yang, Z.Y., Rao, M.N., Elliott, N.C., Kindler, S.D., Popham, T.W. 2009. Differentiating stress induced by greenbugs and Russian wheat aphids in wheat using remote sensing. Computers and Electronics in Agriculture. 67(1-2):64-70.

Interpretive Summary: Outbreaks of greenbug and Russian wheat aphid appear in the Great Plains almost every year and have had significant economic impacts on wheat yields. Early detection of aphid infestation is a critical part of integrated pest management (IPM) for wheat production. A pilot study was done to determine the feasibility of using remote sensing techniques to detect stress in wheat caused by aphid infestation. The purpose of this greenhouse study was to characterize and differentiate stress in wheat caused by infestation due to greenbugs and Russian wheat aphids using a hand-held Cropscan radiometer. Reflectance data and derived vegetation indices from the radiometer were analyzed statistically. Results show that it is possible to discriminate between the two aphid-induced stresses in wheat using a hand-held radiometer. More canopy level studies are needed to identify bands and indices useful for differentiating the two kinds of infestations on wheat under field conditions. Once developed and tested remote sensing methods could be used from aircraft or satellite to monitor fields over broad areas to determine if infestations of either or both aphids were present in fields.

Technical Abstract: Outbreaks of Greenbug (Schizaphis graminum Rondani) and Russian wheat aphid appear in the Great Plains almost every year and have had significant economic impacts on wheat yields. Early detection of aphid infestation is a critical part of integrated pest management (IPM) for wheat and sorghum production. A pilot study was done to determine the feasibility of using remote sensing techniques to detect stress in wheat caused by aphid infestation. The purpose of this greenhouse study was to characterize and differentiate stress in wheat caused by infestation due to greenbugs and Russian wheat aphids using a hand-held Cropscan radiometer. Reflectance data and derived vegetation indices from the 16 bands of the radiometer were analyzed using SAS PROC MIXED statistical analysis procedure. Results show that it is possible to discriminate between the two aphid-induced stresses in wheat using a hand-held radiometer, such as Cropscan. Vegetation indices RVI_800_450 and RVI_950_450 were found useful in differentiating two kinds of infestations on wheat. However, more canopy-level-studies are needed to identify bands and indices used to differentiate two kinds of infestations on wheat under field conditions.