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ARS Home » Plains Area » Manhattan, Kansas » Center for Grain and Animal Health Research » Hard Winter Wheat Genetics Research » Research » Publications at this Location » Publication #307271
Title: Impact of transient heat stress on polar lipid metabolism in seedlings of wheat near-isogenic lines contrasting in resistance to hessian fly (Cecidomyiidae) infestation

Author
item CURRIE, YALEAKA - Fayetteville State University
item Chen, Ming-Shun
item NICKOLOV, RADOSLAV - Fayetteville State University
item Bai, Guihua
item ZHU, LIECENG - Fayetteville State University

Submitted to: Journal of Economic Entomology
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 9/3/2014
Publication Date: 12/1/2014
Publication URL: http://jee.oxfordjournals.org/content/107/6/2196
Citation: Currie, Y., Chen, M., Nickolov, R., Bai, G., Zhu, L. 2014. Impact of transient heat stress on polar lipid metabolism in seedlings of wheat near-isogenic lines contrasting in resistance to hessian fly (Cecidomyiidae) infestation. Journal of Economic Entomology. 107(6):2196-2203. doi:10.1603/EC14286.

Interpretive Summary: Heat stress causes the loss of plant resistance to many parasites, including the Hessian fly Mayetiola destructor, one of the most destructive pests of wheat. However, the mechanism for the loss of plant resistance under heat stress remains unknown. A better understanding of the mechanisms that lead to the loss of plant resistance under heat stress will help us to preserve plant resistance under high heat conditions. This is especially important under the scenario of global climate change. In this study, we found that heat stress can cause significant reduction in the abundance of total detectible polar lipids and double bond index (DBI) in wheat seedlings. We also found that the change in lipid abundance in the resistant wheat cultivar ‘Molly’ was significantly different from that in the susceptible cultivar ‘Newton’ following Hessian fly infestation. Our results suggest that changes in lipid metabolism caused by heat stress may be part of the mechanism that leads to the suppression of wheat resistance to Hessian fly infestation.

Technical Abstract: Transient heat stress compromises resistance of host plants to Hessian fly, Mayetiola destructor (Say), and other biotic stresses. However, the mechanism for the loss of plant resistance under heat stress remains to be determined. In this study, we determined polar lipid profiles in control and Hessian fly-infested resistant and susceptible wheat seedlings with/without heat stress using an automated electrospray ionization-tandem mass spectrometry analysis. Heat stress, alone or in combination with Hessian fly infestation, caused significant reduction in the abundance of total detected polar lipids and double bond index (DBI). Changes in lipid profiles in Molly were similar to those in Newton under heat stress. On the other hand, changes in lipid profiles in Molly were significantly different from those in Newton following Hessian fly infestation. The combination of heat stress and Hessian fly infestation resulted in unique lipid profiles in comparison with those in plants either treated with heat stress or infested with Hessian fly alone. In addition, a greater impact on lipid metabolism was observed in heat-stressed plants infested with Hessian fly than that in plants treated with either heat stress or Hessian fly alone. Our results suggest that changes in lipid metabolism caused by heat stress may be part of the metabolic pathways through which heat stress suppresses resistance of wheat plants to Hessian fly infestation.