Skip to main content
ARS Home » Plains Area » College Station, Texas » Southern Plains Agricultural Research Center » Crop Germplasm Research » Research » Publications at this Location » Publication #322838
Title: Reaction of sorghum lines to zonate leaf spot and rough leaf spot

Author
item Prom, Louis
item ISAKEIT, THOMAS - Texas A&M University
item Cuevas, Hugo
item ROONEY, WILLIAM - Texas A&M University
item PERUMAL, RAMASAMY - Kansas State University
item MAGILL, CLINT - Texas A&M University

Submitted to: Plant Health Progress
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 12/8/2015
Publication Date: 12/14/2015
Citation: Prom, L.K., Isakeit, T., Cuevas, H.E., Rooney, W., Perumal, R., Magill, C. 2015. Reaction of sorghum lines to zonate leaf spot and rough leaf spot. Plant Health Progress. 16(4):230-234.

Interpretive Summary: Zonate leaf spot and rough leaf spot are two fungal diseases of sorghum that can cause yield losses, especially during humid and wet weather conditions. During the 2015 growing season, weather conditions which are important factors in determining the growth and spread of these fungi within a sorghum field were experienced at the Brazos Bottom. Therefore, 181 sorghum lines, including lines from the sorghum association panel were rated for resistance to zonate leaf spot and rough leaf spot. Our work showed that 8 lines, including Dorado and Sureno, two sorghum lines that are used as food sources in certain countries, were resistant to both diseases. These lines could be used in the breeding of zonate leaf spot and rough leaf spot resistant lines in the US and abroad to reduce the impact of these diseases.

Technical Abstract: Abundant, frequent rains, along with humid and cloudy conditions during the early part of the 2015 growing season, provided conducive conditions for an unusually severe outbreak of zonate leaf spot and rough leaf spot in a block of sorghum lines at the Texas A&M AgriLife Research Farm, Burleson County, near College Station, Texas. This afforded the opportunity to evaluate these lines for reaction to these diseases, which normally occur at trace levels in this area. Out of 181 sorghum lines, including a subset of the sorghum association panel, a total of 8 lines, including Dorado, Sureno, PI576434, PI656005, PI656034, PI656075, PI656024, and PI598070 were resistant to both diseases. These lines could be used in breeding programs to introgress the genes for resistance to both diseases into other adapted lines.