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ARS Home » Southeast Area » Stoneville, Mississippi » Crop Genetics Research » Research » Publications at this Location » Publication #338726
Title: Assessment of soybean breeding lines for resistance to Phomopsis seed decay from field trials in Stoneville, Mississippi

Author
item Li, Shuxian
item Smith, James - Rusty

Submitted to: Phytopathology
Publication Type: Abstract Only
Publication Acceptance Date: 5/17/2017
Publication Date: 8/5/2017
Citation: Li, S., Smith, J.R. 2017. Assessment of soybean breeding lines for resistance to Phomopsis seed decay from field trials in Stoneville, Mississippi. Phytopathology. 107(12S):S5.73.

Interpretive Summary:

Technical Abstract: Phomopsis seed decay (PSD) is one of the most important seed diseases in soybean. A fungal pathogen, Phomopsis longicolla (syn. Diaporthe longicolla), is the primary causal agent of PSD. Planting PSD-resistant soybean cultivars is the most effective strategy to manage this disease. However, few commercial cultivars have resistance to PSD. For this study, breeding lines were developed from three crosses between PSD-resistant and high germination parents (DS25-1 x PI 424324B, DS25-1 x PI 417274, DS30-1 x PI 424324B) and from one cross between two PSD-resistant parents (PI 80837 x SS93-6181). Based on seed plating assays of 122 breeding lines from field trails in 2014 and 2015, the range of percent seed infection by P. longicolla among all lines tested was from 0 to 52%, with an overall line mean of 1.9%. There were significant differences in the reaction to PSD among lines derived from DS25-1 x PI 424324B and PI 80837 x SS93-6181. However, there was no PSD incidence in lines derived from DS25-1 x PI 417274 and DS30-1 x PI 424324B. Breeding lines with no Phomopsis seed infection in both years will be tested again in 2017. Resistant lines will be released for future use in developing PSD-resistant soybean cultivars.