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ARS Home » Midwest Area » East Lansing, Michigan » Sugarbeet and Bean Research » Research » Publications at this Location » Publication #341509
Research Project: Nondestructive Quality Assessment and Grading of Fruits and Vegetables

Location: Sugarbeet and Bean Research

Title: Non-destructive defect detection of apples by spectroscopic and imaging technologies: A review

Author
item LU, YUZHEN - Michigan State University
item Lu, Renfu

Submitted to: Transactions of the ASABE
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 7/16/2017
Publication Date: 10/10/2017
Citation: Lu, Y., Lu, R. 2017. Non-destructive defect detection of apples by spectroscopic and imaging technologies: A review. Transactions of the ASABE. 60(5):1765-1790.

Interpretive Summary:

Technical Abstract: Apples are susceptible to a wide range of defects that can occur in the orchard and during the post-harvest period. Detection of these defects by non-destructive sensing techniques is of great importance for the apple industry and has been an intensive research topic over the past two decades. This review presents an overview of common defects in apples, encompassing physiological disorders, mechanical damage, pathological disorders and contamination. Presented and discussed in this review is research progress on the detection of defects in apples using various non-destructive spectroscopic and imaging techniques, including near-infrared spectroscopy, time-resolved/spatially-resolved spectroscopy, fluorescence spectroscopy, monochromatic and color imaging, hyperspectral and multispectral imaging, x-ray imaging, magnetic resonance imaging, thermal imaging, Raman techniques, biospeckle imaging and structured-illumination reflectance imaging. It concludes with remarks on the prospects of these techniques and research needs in the future.