Rhizomania and storage rot resistance in USDA-ARS plant introduction lines evaluated in Idaho, 2017

Authors: Strausbaugh, Carl; Hellier (ctr), Barbara

Submitted to: Plant Disease Management Reports
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 7/1/2018
Publication Date: 8/27/2018
Publication URL: https://handle.nal.usda.gov/10113/6477308
Citation: Strausbaugh, C.A., Hellier, B.C. 2018. Rhizomania and storage rot resistance in USDA-ARS plant introduction lines evaluated in Idaho, 2017. Plant Disease Management Reports. 12:CF155.

Interpretive Summary: Preventing sucrose losses in storage is important to the economic viability of the sugar beet industry. Rhizomania, caused by Beet Necrotic Yellow Vein Virus (BNYVV), is an important viral disease problem worldwide, leading to significant yield loss in both the field and storage. The primary means of controlling these problems is through host resistance. Thus, 30 USDA-ARS Beta vulgaris Plant Introduction (PI) Lines and four check cultivars were screened to characterize them for both resistance to BNYVV and storability. One line (PI 518383) had a level of resistance similar to the BNYVV resistant checks based on foliar ratings and also had a good storage rating. Entry 2 may serve as a starting point for identifying additional sources of resistance to BNYVV and storage rots, which will aid the sugar beet industry in improving sucrose yield and retention in commercial sugar beet cultivars.

Technical Abstract: Rhizomania caused by Beet necrotic yellow vein virus (BNYVV) and storage losses are serious sugar beet production problems. To identify sugar beet germplasm lines with resistance to BNYVV and storage rots, 30 USDA-ARS Beta vulgaris Plant Introduction (PI) Lines and four check cultivars were screened. The lines were grown in a sugar beet field infested with BNYVV during the 2017 growing season in a randomized complete block design with 6 replications. At harvest on 10 October 2017, roots were dug and evaluated for rhizomania symptoms and also placed in an indoor commercial sugar beet storage building. After 133 days in storage, samples were evaluated for the percentage of root surface area covered by fungal growth or rot. Rhizomania symptom development in the field was uniform and other disease problems were not evident in the plot area. The BNYVV susceptible check had 97% foliar symptoms and a high root disease severity rating. The three resistant checks had 0 to 6% foliar symptoms and the lowest root ratings. Based on root ratings, all PI Line entries were more susceptible than the resistant checks and 14 entries were not different from the susceptible check. However, entry 2 (PI 518383) had both the lowest foliar rating of the PI lines and ranked first among all entries for the lowest storage rot. The root rating for entry 2 may have been affected by poor inherent root shape and may not necessarily represent a lack of resistance to BNYVV. The foliar rating and resistance to storage rot both suggest entry 2 should be reevaluated for resistance to BNYVV. Entry 2 may serve as a starting point for identifying additional sources of resistance to BNYVV and storage rots.