Different loci associated with root and foliar resistance to sudden death syndrome (Fusarium virguliforme) in soybean

Authors: TAN, RUIJAN - Michigan State University; COLLINS, PAUL - Michigan State University; WANG, JIE - Michigan State University; WEN, ZHIXIANG - Michigan State University; BOYSE, JOHN - Michigan State University; LAURENZ, RANDALL - Michigan State University; GU, CUIHUA - Michigan State University; JACOBS, JANETTE - Michigan State University; Song, Qijian; CHILVERS, MARTIN - Michigan State University; WANG, DECHUN - Michigan State University

Submitted to: Theoretical and Applied Genetics
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 11/9/2018
Publication Date: 11/16/2018
Citation: Tan, R., Collins, P.J., Wang, J., Wen, Z., Boyse, J.F., Laurenz, R., Gu, C., Jacobs, J.L., Song, Q., Chilvers, M.I., Wang, D. 2018. Different loci associated with root and foliar resistance to sudden death syndrome (Fusarium virguliforme) in soybean. Theoretical and Applied Genetics. 132:501-513. https://doi.org/10.1007/s00122-018-3237-9.
DOI: https://doi.org/10.1007/s00122-018-3237-9

Interpretive Summary: Sudden death syndrome (SDS), caused by soil-borne fungus Fusarium virguliforme, is one of the most important diseases of soybean. Since its first detection in Arkansas in 1971, this disease has spread to all soybean-growing states in the United States. Soybean SDS begins with root infection and then it produces phytotoxins which cause leaf yellowing and necrosis, resulting in yield loss. To monitor this disease, farmers look for soybean root damage and signs of Fusarium colonization, but this is a slow and inefficient process. Now, scientists at Michigan State University and USDA-ARS have discovered that leaf damage traits are better indicators to evaluate SDS resistance to predict yield loss. Furthermore, the scientists have identified DNA and genes that control SDS disease resistance. The information from this study will help farmers evaluate their crops for SDS disease incidence and aid soybean breeders in private and public sectors who want to develop new soybean varieties with improved SDS resistance.

Technical Abstract: Use of resistant cultivars is the most cost-efficient approach to manage soybean sudden death syndrome (SDS) caused by Fusarium virguliforme. The objectives of this study were to 1) map the loci associated with root and foliar resistance to F. virguliforme infection, and 2) decipher the relationships of root infection and foliar damage with plot yield. A mapping population consisting of 153 F4 derived recombinant inbred lines from the cross U01-390489 × E07080 was genotyped by SoySNP6K BeadChip assay. Both foliar damage and F. virguliforme content in roots were investigated in the field and a weak positive correlation was identified between them. Foliar damage had a stronger negative correlation with plot yield than F. virguliforme content. Twelve loci associated with foliar damage were identified and four of them were associated with multiple traits across environments. In contrast, only one locus associated with root resistance to F. virguliforme colonization was identified on Chromosome 18. It colocalized with the locus associated with foliar damage in the same environment. The locus on Chromosomes 6, qSDS6-2 was associated with resistance to SDS phytotoxins, and the locus on Chromosome 18, qSDS18-1, was associated with F. virguliforme colonization in root. Both loci affected plot yield. Foliar damage-related parameters, especially disease index, are valuable indicators for SDS resistance breeding because of consistence and their strong correlation with plot yield. The information provided by this study will facilitate marker-assisted selection to improve SDS resistance in soybean.