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ARS Home » Midwest Area » West Lafayette, Indiana » Crop Production and Pest Control Research » Research » Publications at this Location » Publication #87166
Title: MOLECULAR MAPPING OF A GENE FOR RESISTANCE TO SEPTORIA TRITICI BLOTCH IN WHEAT

Author
item Hu, Xueyi
item Goodwin, Stephen - Steve
item SHANER, GREGORY - PURDUE UNIVERSITY

Submitted to: Plant and Animal Genome VX Conference Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: 1/18/1998
Publication Date: N/A
Citation: N/A

Interpretive Summary:

Technical Abstract: Septoria leaf blotch caused by Mycosphaerella graminicola (aka Septoria tritici) is an important disease of wheat. A population of recombinant inbred lines (RILs) was developed from a cross between the resistant line 72626E2-12-9-1 and the susceptible cultivar Arthur to analyze the inheritance of Septoria resistance and to identify molecular markers linked dto the resistance gene. Genetic analysis of 106 RILs indicated that the resistance in line 72626E2-12-9-1 is controlled by a single dominant gene. Bulked segregant analysis of resistant and susceptible RILs was performed with amplified fragment length polymorphism (AFLP) analysis and simple sequence repeat (SSR) or microsatellite markers. Potentially linked AFLP and SSR markers identified from the bulked segregant analysis were scored on the complete RIL population to determine the linkage relationships. One AFLP marker was loosely linked to the resistance gene at a map distance of approximately 14 cM. A genetic map of the resistance gene will be constructed with additional AFLP and SSR markers using the complete population of recombinant inbred lines.