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ARS Home » Research » Publications at this Location » Publication #96687
Title: RELATIONSHIP BETWEEN VISUAL SCAB RATINGS AND DEOXYNIVALENOL IN WHEAT CULTIVARS

Author
item Bai, Guihua
item Plattner, Ronald
item Desjardins, Anne
item KOLB, FRED - U OF IL, URBANA, IL

Submitted to: Meeting Abstract
Publication Type: Proceedings
Publication Acceptance Date: 10/27/1998
Publication Date: N/A
Citation: N/A

Interpretive Summary:

Technical Abstract: Wheat scab, caused by Fusarium graminearum, is an important disease in the U.S. Deoxynivalenol (DON) produced by F. graminearum in infected wheat grains is detrimental to livestock and also a safety concern in human foods. To identify parameters for indirect selection of wheat cultivars with low DON levels and wheat germplasm accumulating less DON, we conducted experiments to evaluate 115 wheat cultivars collected worldwide for scab resistance in greenhouse in 1997. Wheat plants were inoculated by single spikelet inoculation with a mixture of isolates from wheat seeds grown in a field at Urbana, Illinois, in 1996. Wheat kernels from inoculated spikes of these cultivars were measured for DON levels by using HPLC. Significant correlations were observed between percent scabbed spikelets, area under disease progress curve (AUDPC), seed grade, thousand seed weight, and DON levels. The highest positive correlation coefficient was detected between AUDPC and DON, indicating selecting for low AUDPC in breeding program is most likely to obtain plants with low DON levels. Seventeen wheat lines with less than 2 ppm DON from various origins will be good sources for breeding wheat resistant cultivars with low DON levels.